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Evaluating AlGaN/AlN/GaN heterostructure Schottky barrier heights with flat-band voltage from forward Current-Voltage characteristics

Release time:2019-10-22
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Affiliation of Author(s):
物理学院
Journal:
Applied physics letters
All the Authors:
Meng lingguo
First Author:
linzhaojun
Indexed by:
Unit Twenty Basic Research
Document Code:
lw-96700
Volume:
99
Issue:
12
Page Number:
123504
Translation or Not:
no
Date of Publication:
2011-09-22