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Suppressing Interfacial Layer Degradation in Hf0.5Zr0.5O2-based FeFETs Using a Pre-erase Strategy during Program/Erase Cycling

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Affiliation of Author(s):信息科学与工程学院
First Author:赵国庆
Document Code:8381582CD85E4FDCA9638158672E47B3
Number of Words:3
Translation or Not:no
Date of Publication:2022-06-11
Date of Publication:2022-06-11

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