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    Suppressing Interfacial Layer Degradation in Hf0.5Zr0.5O2-based FeFETs Using a Pre-erase Strategy during Program/Erase Cycling

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    • Institution:信息科学与工程学院

    • Title of Paper:Suppressing Interfacial Layer Degradation in Hf0.5Zr0.5O2-based FeFETs Using a Pre-erase Strategy during Program/Erase Cycling

    • Journal:IEEE Silicon Nanoelectronics Workshop (SNW)

    • First Author:赵国庆

    • Document Code:8381582CD85E4FDCA9638158672E47B3

    • Number of Words:3

    • Translation or Not:No

    • Date of Publication:2022-06

    • Release Time:2023-05-17
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