Using Raman spectroscopy and x-ray diffraction for phase determination in ferroelectric mixed Hf1−xZrxO2-based layers.
发布时间：2026-04-01
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- 论文名称：
- Using Raman spectroscopy and x-ray diffraction for phase determination in ferroelectric mixed Hf1−xZrxO2-based layers.
- 发表刊物：
- Journal of Applied Physics
- DOI码：
- 10.1063/5.0119871
- 是否译文：
- 否
- 发表时间：
- 2022-12
- 发布时间：
- 2026-04-01