Affiliation of Author(s):新一代半导体材料研究院
Journal:IEEE Transactions on Electron Devices
First Author:张斌
Document Code:1D135EA156254FA1A1F53A2C82506B79
Issue:1
Number of Words:4
Translation or Not:no
Date of Publication:2024-04-09
Date of Publication:2024-04-09
徐明升
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Gender:Male
Education Level:Postgraduate (Postdoctoral)
Alma Mater:Shandong University
Paper Publications
The surge current failure and thermal analysis of 4H-SiC Schottky Barrier Diode
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