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Institution:信息科学与工程学院
Title of Paper:Lateral charge migration induced abnormal read disturb in 3D charge-trapping NAND flash memory (vol 13, 054002, 2020)
Journal:Applied Physics Express
First Author:王菲
Document Code:18E1695BB0C44E759D537C7769C12A4E
Volume:13
Issue:7
Number of Words:5
Translation or Not:No
Date of Publication:2020-04
Release Time:2021-06-01