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Lateral charge migration induced abnormal read disturb in 3D charge-trapping NAND flash memory (vol 13, 054002, 2020)
Affiliation of Author(s):信息科学与工程学院
Journal:Applied Physics Express
First Author:王菲
Indexed by:Unit Twenty Basic Research
Document Code:18E1695BB0C44E759D537C7769C12A4E
Volume:13
Issue:7
Translation or Not:no
Date of Publication:2020-04-17