Professor
Supervisor of Master's Candidates
The Last Update Time: ..
Charge-assisted Recovery and Degradation in Charge-trapping 3D NAND Flash Memory, Experimental Evidences and Theoretical Perspectives
Affiliation of Author(s):信息科学与工程学院
First Author:马晓雷
Document Code:1395264240339652610
Page Number:41-42
Number of Words:3
Translation or Not:no
Date of Publication:2020-06-13