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Institution:信息科学与工程学院
Title of Paper:Charge-assisted Recovery and Degradation in Charge-trapping 3D NAND Flash Memory, Experimental Evidences and Theoretical Perspectives
Journal:IEEE Silicon Nanoelectronics Workshop (SNW)
First Author:马晓雷
Document Code:1395264240339652610
Page Number:41-42
Number of Words:3
Translation or Not:No
Date of Publication:2020-06
Release Time:2023-05-18