Qr code
中文
Xuepeng Zhan

Professor
Supervisor of Master's Candidates


Gender:Male
Alma Mater:吉林大学
Education Level:Postgraduate (Postdoctoral)
Degree:Doctor
Status:Employed
School/Department:信息科学与工程学院
Date of Employment:2019-07-01
E-Mail:zhanxuepeng@sdu.edu.cn
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TID Radiation Impacts on Charge-trapping Macaroni 3D NAND Flash Memory

Hits: Praise

Affiliation of Author(s):信息科学与工程学院

Key Words:Charge trapping;Failure (mechanical);Failure analysis;Integrated circuits;Ionizing radiation;Irradiation;Leakage currents;Memory architecture;Metals;NAND circuits;Threshold voltage

First Author:秦琦

Document Code:1395301829817929729

Volume:2020-July

Number of Words:3

Translation or Not:no

Date of Publication:2020-07-20