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中文
Xuepeng Zhan

Professor
Supervisor of Master's Candidates


Gender:Male
Alma Mater:吉林大学
Education Level:Postgraduate (Postdoctoral)
Degree:Doctor
Status:Employed
School/Department:信息科学与工程学院
Date of Employment:2019-07-01
E-Mail:zhanxuepeng@sdu.edu.cn
Click:Times

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Significant Reliability Improvement by Inducing Dual Atomic-Thin Titanium Intercalation Layers in Hf<sub>0.5</sub>Zr<sub>0.5</sub>O<sub>2</sub> Films

Hits: Praise

Affiliation of Author(s):信息科学与工程学院

Journal:IEEE Electron Device Letters

First Author:台路

Document Code:CF164AC117BB45CE8FAA0F82BEDC4AE4

Volume:44

Issue:5

Page Number:753

Number of Words:3000

Translation or Not:no

Date of Publication:2023-05-01