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Impacts of silicon carbide defects on electrical characteristics of SiC devices
Release Time:2025-02-25| Hits:
Institution:新一代半导体材料研究院
Title of Paper:Impacts of silicon carbide defects on electrical characteristics of SiC devices
Journal:JOURNAL OF APPLIED PHYSICS
First Author:来玲玲
Document Code:D5742555117F4661AA6914F43C395CBC
Issue:060701
Page Number:1
Number of Words:5000
Translation or Not:No
Date of Publication:2025-02
Release Time:2025-02-25
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