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The surge current failure and thermal analysis of 4H-SiC Schottky Barrier Diode
Release Time:2025-05-24| Hits:
Institution:新一代半导体材料研究院
Title of Paper:The surge current failure and thermal analysis of 4H-SiC Schottky Barrier Diode
Journal:IEEE Transactions on Electron Devices
First Author:张斌
Document Code:1D135EA156254FA1A1F53A2C82506B79
Issue:1
Number of Words:4
Translation or Not:No
Date of Publication:2024-04
Release Time:2025-05-24
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