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一种确定GaN晶体管纳米尺寸栅长二维电子气面密度的方法
2024-05-18 Hits:
Affilication of Author(s):新一代半导体材料研究院
Type of Patent:发明
Application Number:202310430551.0
Number of Inventors:8
Service Invention or Not:no
Application Date:2023-04-18
Publication Date:2024-01-30
Authorization Date:2024-01-30
Publication Date:2024-01-30
Application Date:2023-04-18
Authorization Date:2024-01-30
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