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Handoko LINEWIH


Gender:Male
School/Department:新一代半导体材料研究院
Date of Employment:2023-02-20
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Failure Phenomenon of 4H-SiC Schottky Barrier Diode Under Thermal Shock Reliability Test

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Affiliation of Author(s):新一代半导体材料研究院

First Author:曾繁朋

Document Code:269EBC8BD4C5473D8AA0C7CCC9FFB067

Number of Words:5000

Translation or Not:no

Date of Publication:2024-11-18

 

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