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LI Yuan

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Postgraduate (Doctoral)

Shandong University

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Date of Employment:2017-12-26

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Yuan Li > Scientific Research > Paper Publications

Lateral charge migration induced abnormal read disturb in 3D charge-trapping NAND flash memory (vol 13, 054002, 2020)

Release Time:2021-06-02 Hits:

Institution:信息科学与工程学院
Journal:Applied Physics Express
First Author:王菲
Document Code:18E1695BB0C44E759D537C7769C12A4E
Volume:13
Issue:7
Number of Words:5
Translation or Not:No
Date of Publication:2020-04

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