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LI Yuan

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Postgraduate (Doctoral)

Shandong University

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Date of Employment:2017-12-26

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Yuan Li > Scientific Research > Paper Publications

Charge Loss Induced by Defects of Transition Layer in Charge-Trap 3D NAND Flash Memory

Release Time:2021-09-19 Hits:

Institution:信息科学与工程学院
Journal:IEEE Access
First Author:王菲
Document Code:DDB32CAA6D8F46AFB2D18B778EC4B2BA
Volume:9
Page Number:47391
Number of Words:3
Translation or Not:No
Date of Publication:2021-03

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