Deep insights into the failure mechanisms in field-cycled ferroelectric Hf0.5Zr0.5O2Thin Film: TDDB characterizations and first-principles calculations
Date of Publication:2020-12-18 Hits:
Affiliation of Author(s):信息科学与工程学院
Document Code:1402446252980834306
Volume:2020-December
Page Number:39.6.1-39.6.4
Number of Words:3
Translation or Not:no
Date of Publication:2020-12-18
