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Institution:信息科学与工程学院
Title of Paper:Suppressing Interfacial Layer Degradation in Hf0.5Zr0.5O2-based FeFETs Using a Pre-erase Strategy during Program/Erase Cycling
Journal:IEEE Silicon Nanoelectronics Workshop (SNW)
First Author:赵国庆
Document Code:8381582CD85E4FDCA9638158672E47B3
Number of Words:3
Translation or Not:No
Date of Publication:2022-06
Release Time:2023-05-17