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Institution:信息科学与工程学院
Title of Paper:Deep insights into the failure mechanisms in field-cycled ferroelectric Hf0.5Zr0.5O2Thin Film: TDDB characterizations and first-principles calculations
Journal:IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM)
Document Code:1402446252980834306
Volume:2020-December
Page Number:39.6.1-39.6.4
Number of Words:3
Translation or Not:No
Date of Publication:2020-12
Release Time:2023-05-18