Institution:信息科学与工程学院
Journal:2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2020
Key Words:Charge trapping;Failure (mechanical);Failure analysis;Integrated circuits;Ionizing radiation;Irradiation;Leakage currents;Memory architecture;Metals;NAND circuits;Threshold voltage
First Author:秦琦
Document Code:1395301829817929729
Volume:2020-July
Number of Words:3
Translation or Not:No
Date of Publication:2020-07