LI Yuan

Doctor

Postgraduate (Doctoral)

Shandong University

Personal Information:

Gender:Male
Date of Employment:2017-12-26

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Yuan Li > Scientific Research > Paper Publications

TID Radiation Impacts on Charge-trapping Macaroni 3D NAND Flash Memory

Date of Publication:2020-07-20 Hits:

Affiliation of Author(s):信息科学与工程学院
Key Words:Charge trapping;Failure (mechanical);Failure analysis;Integrated circuits;Ionizing radiation;Irradiation;Leakage currents;Memory architecture;Metals;NAND circuits;Threshold voltage
First Author:秦琦
Document Code:1395301829817929729
Volume:2020-July
Number of Words:3
Translation or Not:no
Date of Publication:2020-07-20

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