LI Yuan

Doctor

Postgraduate (Doctoral)

Shandong University

Personal Information:

Gender:Male
Date of Employment:2017-12-26

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Yuan Li > Scientific Research > Paper Publications

Impacts of atomistic surface roughness on electronic transport in n-type and ptype MoS2 field-effect transistors

Date of Publication:2019-10-22 Hits:

Affiliation of Author(s):信息科学与工程学院
Journal:JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS
Document Code:7CBB8FBD3AEA4E0B8B27639F2A5CF3DC
Issue:1
Number of Words:2
Translation or Not:no
Date of Publication:2019-10-22

Pre One:Geometric, Electronic, and Transport Predictions on Two-Dimensional Semiconducting Silicon with Kagome Lattice: Implications for Nanoscale Field-Effect Transistor Applications

Next One:Spontaneous polarization enhancement in ferroelectric Hf0.5Zr0.5O2 using atomic oxygen defects engineering: An ab initio study

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