GQFRmyY0NxJJdVLK5psvH4eEaLz90Wf4VtnKfJhbQCHgGMRO7kKhwwasMdW6
LI Yuan

Doctor

Postgraduate (Doctoral)

Shandong University

Recommended MA Supervisor

Personal Information

Gender:Male
Date of Employment:2017-12-26

VIEW MORE

Other Contact Information

Email :


Yuan Li > Scientific Research > Paper Publications

Impacts of atomistic surface roughness on electronic transport in n-type and ptype MoS2 field-effect transistors

Release Time:2023-09-28 Hits:

Institution:信息科学与工程学院
Journal:JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS
Document Code:7CBB8FBD3AEA4E0B8B27639F2A5CF3DC
Issue:1
Number of Words:2
Translation or Not:No
Date of Publication:2019-10

Prev One:Geometric, Electronic, and Transport Predictions on Two-Dimensional Semiconducting Silicon with Kagome Lattice: Implications for Nanoscale Field-Effect Transistor Applications

Next One:Spontaneous polarization enhancement in ferroelectric Hf0.5Zr0.5O2 using atomic oxygen defects engineering: An ab initio study

Copyright All Rights Reserved Shandong University Address: No. 27 Shanda South Road, Jinan City, Shandong Province, China: 250100
Information desk: (86) - 0531-88395114
On Duty Telephone: (86) - 0531-88364731 Construction and Maintenance: Information Work Office of Shandong University

Click:  | The Last Update Time:..  | Login | SDU