Enhancement of On-State Current in Two-Dimensional Tunnel Field Effect Transistors by Computational Designof Interfacial vander Waals Defect States
所属单位:信息科学与工程学院
论文名称:Enhancement of On-State Current in Two-Dimensional Tunnel Field Effect Transistors by Computational Designof Interfacial vander Waals Defect States
发表刊物:ACS Applied Nano Materials
第一作者:王隆昊
论文编号:B5C8AA269CEA4E5380DEAD4A3FC9646A
卷号:8
期号:50
页面范围:24057
字数:5
是否译文:否
发表时间:2025-12