A Hybrid Simulation Technique to Investigate Bias-Dependent Electron Transport and Self-Heating in AlGaN/GaN HFETs
Affiliation of Author(s):
集成电路学院
Journal:
IEEE Transactions on Electron Devices
First Author:
王鸣雁
Document Code:
1703670853552254977
Page Number:
1-5
Number of Words:
3
Translation or Not:
no
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