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张斌. The surge current failure and thermal analysis of 4H-SiC Schottky Barrier Diode. IEEE Transactions on Electron Devices, 2025.
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陈思衡. High Breakdown Voltage P-GaN Gate HEMTs With Threshold Voltage of 7.1 V. IEEE Electron Device Letters, 12, 2343, 2024.
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罗鑫. Enhanced device performance of GaN high electron mobility transistors with in situ crystalline SiN cap layer. APPLIED PHYSICS LETTERS, 125, 2024.
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王鸣雁. Impact of electron velocity modulation on microwave power performance for AlGaN/GaN HFETs. APPLIED PHYSICS LETTERS, 2024.
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王鸣雁. Bias-dependent electron velocity and short-channel effect in scaling sub-100?nm InAlN/GaN HFETs. APPLIED PHYSICS LETTERS, 2024.
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王鸣雁. Modeling of the Gate Bias-Dependent Velocity–Field Relationship and Physics-Based Current-Voltage Characteristics in AlGaN/GaN HFETs. IEEE ACCESS, 2024.
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王明绪. Toward low-power-consumption source-gated phototransistor. APPLIED PHYSICS LETTERS, 2024.
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陈思衡. Improved electrical performance of InAlN/GaN high electron mobility transistors with forming gas annealing. Solid-State Electronics, 213, 2024.
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