Patents
一种确定GaN晶体管纳米尺寸栅长二维电子气面密度的方法
  • Affilication of Author(s):
    新一代半导体材料研究院
  • Type of Patent:
    发明
  • Application Number:
    202310430551.0
  • Number of Inventors:
    8
  • Service Invention or Not:
    no
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