Paper Publications
Effect of Polarization Coulomb Field Scattering on Electrical Properties of the 70-nm Gate-Length AlGaN/GaN HEMTs
-
Journal:
Scientific Reports
-
All the Authors:
Yuanjie Lv,Chen Fu,Huan Liu,Aijie Cheng,Chongbiao Luan,Yang Zhou
-
First Author:
Peng Cui
-
Correspondence Author:
Zhaojun Lin
-
Volume:
8
-
Page Number:
12850
-
Translation or Not:
no
-
Included Journals:
SCI