Paper Publications
Effect of Polarization Coulomb Field Scattering on Electrical Properties of the 70-nm Gate-Length AlGaN/GaN HEMTs
  • Journal:
    Scientific Reports
  • All the Authors:
    Yuanjie Lv,Chen Fu,Huan Liu,Aijie Cheng,Chongbiao Luan,Yang Zhou
  • First Author:
    Peng Cui
  • Correspondence Author:
    Zhaojun Lin
  • Volume:
    8
  • Page Number:
    12850
  • Translation or Not:
    no
  • Included Journals:
    SCI
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