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Determination of the strain distribution for the Si3N4 passivated AlGaN/AlN/GaN heterostructure field-effect transistors
  • Journal:
    Superlattices and Microstructures
  • All the Authors:
    Yan Liu,Peng Cui,Yuanjie Lv,Yang Zhou,Gang Dai,Chongbiao Luan
  • First Author:
    Chen Fu
  • Indexed by:
    Journal paper
  • Correspondence Author:
    Zhaojun Lin
  • Volume:
    111
  • Page Number:
    806
  • Translation or Not:
    no
  • Included Journals:
    SCI
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