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教师个人主页
？？Effect of Polarization Coulomb Field Scattering on Parasitic Source Access Resistance and Extrinsic Transconductance in AlGaN/GaN Heterostructure FETs . ？IEEE TRANSACTIONS ON ELECTRON DEVICES, 63,2016.
孟令国 and 林兆军.Influence of the side-Ohmic contact processing on the polarization Coulomb field scattering in AlGaN/AlN/GaN heterostructure field-effect transistors . Applied physics letters, 101:113501,2012.
孟令国 and 林兆军.Influence of the ratio of gate length to drain-to-source distance on the electron mobility in AlGaN/AlN/GaN heterostructure field-effect transistors . Nanoscale research letters, 7:434,2012.
孟令国 and 林兆军.Polarization Coulomb field scattering in In0.18Al0.82N/AlN/GaN heterostructure field-effect transistors. Journal of applied physics, 112:054513,2012.
孟令国 and 林兆军.A simple method of extracting the polarization charge density in the AlGaN/GaN heterostructure from current-voltage and capacitance-voltage characteristics . Chinese Physics B, 21:097104,2012.
林兆军.Determination of the series resistance under the Schottky contacts of AlGaN/AlN/GaN Schottky barrier diodes. Chinese Physics B, 21:017103-1,2012.
林兆军, 程爱杰 and 崔鹏.Effect of Different Gate Lengths on Polarization Coulomb Field Scattering Potential in AlGaN/GaN Heterostructure Field-Effect Transistors. scientific reports, 8,2018.
