Deep insights into the failure mechanisms in field-cycled ferroelectric Hf0.5Zr0.5O2Thin Film: TDDB characterizations and first-principles calculations
发布时间：2023-05-18 点击数：
所属单位：信息科学与工程学院
论文名称：Deep insights into the failure mechanisms in field-cycled ferroelectric Hf0.5Zr0.5O2Thin Film: TDDB characterizations and first-principles calculations
发表刊物：IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM)
论文编号：1402446252980834306
卷号：2020-December
页面范围：39.6.1-39.6.4
字数：3
是否译文：否
发表时间：2020-12